Generic P75-J1 Probe, 75mil

The P75-J1 is a spring-loaded test probe from the generic P75 family, used to make temporary contact with a test point on a PCB during in-circuit and functional test. It mounts in a matching receptacle in the fixture's probe plate, so a worn or bent probe can be replaced from the top without rewiring.

The P75 family is the middle tier of the generic range — closer-pitched than P100, more robust than P50 — with a 1.73 mm (68 mil) minimum centre distance, about 2 mm of working travel and a 100 g spring that keeps aggregate board loading manageable across a large probe field. The suffix identifies the tip geometry within that common body, so a J1 can be substituted for any other P75 in the same receptacle when a test point needs a different contact style.

• Generic P75 family, J1 tip variant
• Family-typical minimum centre distance 1.73 mm (68 mil)
• Family-typical working stroke 2 mm, full stroke 2.5 mm
• Family-typical spring force 100 g at working stroke
• Family-typical current rating 3 A, contact resistance 50 mΩ
• Receptacle-mounted; replaceable from the top of the fixture
• Sold per unit