Generic P75-E2 Test Probe, 75mil

The P75-E2 is a spring-loaded test probe from the generic P75 family, used to make temporary contact with a test point on a PCB during in-circuit and functional test. It mounts in a matching receptacle in the fixture's probe plate, so a worn or bent probe can be pulled and replaced from the top without disturbing the wiring underneath.

The P75 family is the middle tier of the generic range: closer-pitched than the P100 probes and more robust than the P50, with a 1.73 mm (68 mil) minimum centre distance, roughly 2 mm of working travel and a 100 g spring — light enough that a few hundred probes landing together does not overload the board. Within that common body, the suffix identifies the tip geometry, so a P75-E2 can be swapped for any other P75 in the same receptacle when a test point needs a different contact style.

• Generic P75 family, E2 tip variant
• Family-typical minimum centre distance 1.73 mm (68 mil)
• Family-typical working stroke 2 mm, full stroke 2.5 mm
• Family-typical spring force 100 g at working stroke
• Family-typical current rating 3 A, contact resistance 50 mΩ
• Receptacle-mounted; replaceable from the top of the fixture
• Sold per unit