The P75-B1 is a spring-loaded test probe from the generic P75 family, used to make temporary contact with a test point on a PCB during in-circuit and functional test. It mounts in a matching receptacle in the fixture's probe plate, so a worn or bent probe can be pulled and replaced from the top without disturbing the wiring underneath.
The B1 spear tip is the general-purpose choice for bare vias, through-hole leads and tinned pads — the point breaks through light flux residue and centres itself in a via rather than skating off the edge. The P75 family sits in the middle of the generic ladder, closer-pitched than P100 and more robust than P50, and 100 g of spring force at working stroke keeps total board loading manageable when several hundred probes land at once.
