Generic P50-LM2 Probe, Star Tip, 50mil

The P50-LM2 is a spring-loaded test probe from the generic P50 family, the finest-pitch tier of the generic range, used to contact test points on dense PCBs during in-circuit and functional test. It mounts in a matching receptacle in the fixture's probe plate so tips can be replaced from the top as they wear.

The LM2 star tip puts several sharp points on the target instead of one, so it bites through oxide and flux residue on flat plated pads and gives a more forgiving contact than a single spear point when pad finish is inconsistent. Choose it over the A2 cup when the target is a flat pad rather than a bump, and over the B1 spear when contact resistance on lead-free or oxidised pads is proving unreliable. At 1.22 mm (48 mil) minimum centre distance it is the closest-pitched star tip in the generic range.

• Star (LM2) tip
• Probe diameter 0.9 mm, tip diameter 0.9 mm
• Working stroke 2 mm, full stroke 2.65 mm
• Spring force 75 g at working stroke
• Current rating 3 A, contact resistance 50 mΩ
• Minimum centre distance 1.22 mm (48 mil)
• Moving-plate hole diameter 2 mm