Generic P50-E2 Test Probe, 50mil
Generic P50-E2 Test Probe, 50mil
1100 in stockAdditional qty ships in 3-4 weeks
The P50-E2 is a spring-loaded test probe from the generic P50 family, the finest-pitch tier of the generic range, used to contact test points on dense PCBs during in-circuit and functional test. It mounts in a matching receptacle in the fixture's probe plate so probes can be changed from the top as tips wear.
Reach for a P50 when the target grid is too tight for a P75: a 1.22 mm (48 mil) minimum centre distance lets probes sit roughly a third closer together. The trade is mechanical — a slimmer plunger, a lighter 75 g spring, and less tolerance of side load and mis-registration. Within the common P50 body the suffix identifies the tip geometry, so an E2 can be swapped for any other P50 in the same receptacle when a test point calls for a different contact style.
- Generic P50 family, E2 tip variant
- Family-typical minimum centre distance 1.22 mm (48 mil)
- Family-typical working stroke 2 mm, full stroke 2.65 mm
- Family-typical spring force 75 g at working stroke
- Family-typical current rating 3 A, contact resistance 50 mΩ
- Receptacle-mounted; replaceable from the top of the fixture
- Sold per unit
Share
