The P50-B1 is a spring-loaded test probe from the generic P50 family, the finest-pitch tier of the generic range, used to contact test points on dense PCBs during in-circuit and functional test. It mounts in a matching receptacle in the fixture's probe plate so probes can be changed from the top as tips wear.
Reach for a P50 when the target grid is too tight for a P75 — a 1.22 mm (48 mil) minimum centre distance lets probes sit roughly a third closer together than the P75 family allows. The trade is mechanical: the plunger is slimmer, the 75 g spring is lighter, and the probe is correspondingly less tolerant of side load and mis-registration. The B1 spear tip suits bare vias and tinned pads, where the point cuts through light surface residue and self-centres in a plated hole.
