Generic P100-LM2 Probe, Star Tip, 100mil

The P100-LM2 is a spring-loaded test probe from the generic P100 family, the coarsest-pitch and most robust tier of the generic range, used to contact test points on a PCB during in-circuit and functional test. It mounts in a matching receptacle in the fixture's probe plate so probes can be replaced from the top without disturbing the wiring.

The LM2 star tip lands several sharp points on the target rather than one, biting through oxide and flux residue on flat plated pads where a single spear point would give an intermittent reading. The P100 body carries that tip on a much longer travel than the P50 and P75 families — 4.3 mm working and 6.35 mm full stroke — which absorbs board warp and stack-up tolerance on larger assemblies, and the 180 g spring drives the points home. The cost is footprint: it needs 2.16 mm (85 mil) between probe centres, so it is the wrong choice on a tight grid.

• Star (LM2) tip
• Probe diameter 1.5 mm, tip diameter 1.8 mm
• Working stroke 4.3 mm, full stroke 6.35 mm
• Spring force 180 g at working stroke
• Current rating 3 A, contact resistance 50 mΩ
• Minimum centre distance 2.16 mm (85 mil)
• Moving-plate hole diameter 3 mm