Generic P100-B1 Probe, Needle Tip, 100mil

A P100-series spring test probe with a spear tip, for use with a matching P100 receptacle in a fixture's probe plate. The P100 family is the 100 mil (2.54 mm) class workhorse: the pitch most in-circuit and functional test fixtures are built on, and the size that keeps probe replacement straightforward over the life of a fixture.

The spear tip concentrates the spring force on a single sharpened point, so it punches through flux residue and light oxide and lands precisely on a small pad or land. That precision is the reason to choose it over a crown or cup head; the cost is that it will witness the target surface, so for plated or cosmetically sensitive contacts pick a cupped or radiused tip instead. At 180 gf this carries a firm spring for its class, which suits contaminated boards but adds up quickly across a dense probe field.

• Spear tip; tip diameter 1.05 mm, plunger diameter 1 mm
• Minimum centre distance 2.16 mm (85 mil); moving-plate hole ø2 mm
• Working stroke 4.3 mm, full stroke 6.35 mm
• Spring force 180 gf at working stroke
• 3 A rated current, typical resistance 50 mΩ
• Sold per unit; requires a matching P100 receptacle