Generic P100-A2 Probe, Cupped Tip, 100mil

A P100-series spring test probe with a cupped tip, for use with a matching P100 receptacle in a fixture's probe plate. The P100 family is the 100 mil (2.54 mm) class workhorse used for most in-circuit and functional test fixtures, coarse enough to be easy to build and maintain.

The cup is a concave head with a raised rim, shaped to receive the top of a round target rather than press on a flat one. The rim captures and centres a solder bead, a through-hole lead end or a header pin as the probe compresses, so contact does not depend on the fixture landing dead centre, and the load spreads around the rim instead of concentrating on a point. Choose it wherever the target is domed or round; choose a spear or crown tip for flat pads. At ø1.5 mm this is a wide cup, sized for the larger lead and bead diameters, and the 180 gf spring gives it a firm seat.

• Cup tip; tip diameter 1.5 mm, plunger diameter 1.5 mm
• Minimum centre distance 2.16 mm (85 mil); moving-plate hole ø3 mm
• Working stroke 4.3 mm, full stroke 6.35 mm
• Spring force 180 gf at working stroke
• 3 A rated current, typical resistance 50 mΩ
• Sold per unit; requires a matching P100 receptacle